Christian Monzio Compagnoni


Christian Monzio Compagnoni

  • Electron Devices (Laurea Magistrale) codice 095155

Christian Monzio Compagnoni received the Laurea (cum laude) degree in Electronic Engineering and the Ph.D. degree in Information Technology from the Politecnico di Milano, Milan, Italy, in 2001 and 2005, respectively. Since 2006 he has been with the Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, Milan, Italy, first in the capacity of Assistant Professor (from April 2006 to March 2015) and then of Professor of Electronic Engineering (since March 2015). 

Christian Monzio Compagnoni’s research interests are in micro/nano-electronic devices and technologies. In particular, he has been performing research activities on the basic physics, the operation and the reliability of solid-state devices and technologies for data storage for 15+ years, with emphasis on the NAND Flash technology. Activities have been done in collaboration with some of the most important semiconductor companies in the world and led to more than 120 papers (Scopus) published in international journals and conference proceedings (with 40+ papers published in the IEEE-Transactions on Electron Devices, 15+ papers published in the IEEE-Electron Device Letters and 15+ papers presented at the IEEE-International Electron Devices Meeting) and to 2 US patents. 

Christian Monzio Compagnoni was the recipient of 5 awards at the IEEE-International Reliability Physics Symposium (“Outstanding paper Award” in 2008, “Best Student Paper Award” in 2012, 2013 and 2014, and “Best Poster Award” in 2015) and served in the technical program committee of the same conference in 2009 (“Memory” committee), 2010 (“Memory” committee) and 2016 (“Memory and product IC reliability” committee). He has been serving as Associate Editor of the IEEE-Transactions on Electron Devices since November 2015, arranging the review of papers in the area “Memory Devices and Technologies”. Christian Monzio Compagnoni was elevated to the grade of Senior Member of the IEEE in 2014.